Observing Beam Motion Using Infrared Interferometry
نویسندگان
چکیده
Phase noise in the RF master oscillator driving synchrotron oscillations of the beam has been identified as one of the dominant sources of noise in the infrared beamline at the Advanced Light Source. We present measurements of the effect of the electron beam motion in a Fourier transform interferometer (FTIR) detector. This form of detector may be sensitive to very small beam motions.
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تاریخ انتشار 1999